Program overview

The sorting machine is for sorting cells with defects in color or appearance (front and back) and insufficient electrical performance

Our solution

Program Features

  • High industry coverage

    Achieve the high-speed full inspection and grading of the size, line marks, warpage, surface defects, cracks, electric energy and other characteristics of silicon wafers of various processes such as single crystal and polycrystalline
  • High stability

    Non-contact “0”damage, sorting and testing
  • High efficiency

    Automatic collection and real-time upload of detection and sorting data and equipment status data, convenient control and maintenance, high efficiency